OverViz Blog

dust-particle-chargeup-plasma-corona

This example demonstrates charge-up of initially charge-free dust particles as they move through a pin-corona plasma. Two sets of particles move through the corona with different initial velocities. The dust particles are subject to Lorentz forcing in the electric field and their resulting trajectories are compared. The macroscopic particle dynamics is modeled in VizGrain and coupled to a background plasma solution modeled in VizGlow. The 2D planar pin geometry and mesh is shown in Figure

Applications
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  Esgee Technologies will present “Modeling of Electrode Erosion for Prediction of Spark Plug Lifetime” at the SAE International World Congress Experience 2018, April 10-12, at the Cobo Center in Detroit, Michigan.   Abstract: The maximum lifetime of a spark plug is limited by electrode erosion.  Over the course of millions of repeated sparking events, the electrode material ablates and the electrode gap increases which degrades performance.  Once a critical gap is

Announcements, News

  Esgee Technologies will present “Simulation of Arc Quenching in Hermetically Sealed Electric Vehicle Relays” at the SAE International World Congress Experience 2018, April 10-12, at the Cobo Center in Detroit, Michigan.   Abstract High-voltage relays perform a key role in determining safety and protections of Electric Vehicles(EV)/ hybrid automotive systems. The primary function of a high voltage relay is to mechanically separate electrodes under a short circuit situation, and isolate the

Announcements, News
Capacitively Coupled Plasma Simulation in VizGlow

Ion energy and angular distribution functions (IEADFs) characterize the anisotropic impact behavior of ions onto wafer surfaces in cold plasma reactive ion etchers (RIE). IEADFs can be used to quantify the etching performance and guide reactor design in the semiconductor fabrication process. Reducing the angles of ion impact at the wafer surface sharpens the resolution of the etching process, enabling the production of smaller etched features. Controlling the ion energy distributions also offers control over

Applications
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February 7, 2018

OverViz 2.2.1 Released

Esgee Technologies Inc. would like to announce the release of OverViz Suite v2.2.1. This release contains minor bug fixes and software maintenance updates for improved usability. New installers and installation instructions are available for download from the Esgee Corporate Portal.

Announcements